Registration Desk and Hours
November 22, 11:30~18:00
November 23, 8:30~16:00
Entrance of Room 201B(2F) (See Guide Map Here)
Keynote Address (more detail: click the title!)
"Hardware Trojans: Threats and Emerging Solutions"
R. S. Chakraborty (Indian Institute of Technology, Kharagpur)
Invited Talk (more detail: click the title!)
"TRUDEVICE: a COST Action in Europe"
I. Polian (University of Passau)
"The Past and Future of WRTLT"
Y. Min (Chinese Academy of Sciences), H. Fujiwara (Osaka Gakuin University)
"System Level Testing Considerations as we Move from RTL to ESL"
Z. Navabi (University of Tehran)
Visa Guide information is now available!
WRTLT'12 Organizing Committee will send
visa letters (confirmation letters) to attendees requesting them.
Please contact Registration Chair (e-mail: firstname.lastname@example.org) if you request visa letters.
IEEE Computer Society Test Technology Technical Council
The IEICE Information and Systems Society,
Technical Committee on Dependable Computing
The purpose of this workshop is to bring researchers and practitioners
of LSI testing from all over the world together to exchange ideas and experiences
in register transfer level (RTL) and high level testing. WRTLT'12, the
thirteenth workshop, will be held in conjunction with the 21st Asian Test
Symposium (ATS'12) in Niigata, Japan. We hope and expect this workshop
provides an ideal forum for frank discussion on this important topic for
the future system-on-a-chip(SoC) devices and 3D ICs. Areas of interest
include but are not limited to:
- High level Testing : RTL/Behavior level testing, High level approaches
for testing, RTL ATPG, RTL DFT, RTL BIST, High level synthesis for testability,
Relationship between RTL and gate level testing, Functional fault modeling,
- High level test bench generation
- 3D IC Testing
- SoC/Noc Testing: Test scheduling, Core testing, Interconnect testing
- Reliable SoC : System level reliability, Self repair, Fault tolerant SoC
- Microprocessor Testing
- Design Verification
- Gate Level Test Related Issues : Low power testing, Test compression, ATPG, DFT, BIST
- Secure Testing
- Hardware Trojan Detection
Authors are invited to submit paper proposals for presentation at the workshop.
The proposal may be an extended summary (1,000 words) or a full paper and
should include: title, full name and affiliation of all authors, 50 words
abstract, keywords and the name of contact author. All submissions are
now to be made electronically through the EasyChair conference system. Detailed instructions for submissions are to be found the website. Electronic
submissions in PDF files are strongly recommended. Please visit the following
website for submissions.
|Photocopies of accepted papers will be handed out to the attendees at the workshop site.
- Submission deadline: Sep. 9, 2012
- Notification of acceptance: October 1, 2012
- Camera ready due: October 26, 2012
- Workshop days: November 22-23, 2012