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    About WRTLT       Present Event    

The purpose of IEEE Workshop on RTL and High Level Testing (WRTLT) is to bring researchers and practitioners on LSI testing from all over the world together to exchange ideas and experiences on register transfer level (RTL) and high level testing.  


18th Workshop on RTL and High Level Testing
Nov. 30 - Dec. 1, 2017, Taipei, Taiwan

  Past Events
17th WRTLT'16 Hiroshima, Japan November 24-25, 2016
16th WRTLT'15 Bombay, India November 25-26, 2015
15th WRTLT'14 Hangzhou, China November 19-20, 2014
14th WRTLT'13 Yilan, Taiwan November 21-22, 2013
13th WRTLT'12 Niigata, Japan November 22-23, 2012
12th WRTLT'11 Jaipur, India November 25-26, 2011
11th WRTLT'10 Shanghai, China December 5-6, 2010
10th WRTLT'09 Hong Kong, China November 27-28, 2009
9th WRTLT'08 Sapporo, Japan November 27-28, 2008
8th WRTLT'07 Beijing, China October 12-13, 2007
7th WRTLT'06 Fukuoka, Japan November 23-24, 2006
6th WRTLT'05 Harbin, China July 20-21, 2005
5th WRTLT'04 Osaca, Japan November 11-12, 2004
4th WRTLT'03 Xian, China November 20-21, 2003
3rd WRTLT'02 Guam, USA November 21-22, 2002
2nd WRTLT'01 Nara, Japan November 22-23, 2001
1st WRTLT'00 Changsha, China September 26-27, 2000
Steering Committee (2017-2019)

Toshinori Hosokawa, Nihon University, Japan


Shyue-Kun Lu, National Taiwan University of Science and Technology, Taiwan


Masayuki Arai, Nihon University, Japan
Zhengfeng Huang, Hefei University of Technology, China
Hideyuki Ichihara, Hiroshima City University, Japan
Erik Larsson, Lund University, Sweden
Kuen-Jong Lee, National Cheng Kung University, Taiwan
Huawei Li, Chinese Academy of Sciences, China
Satoshi Ohtake, Oita University, Japan
Matteo Sonza Reorda, Politecnico di Torino, Italy
Virendra Singh, Indian Institute of Technology Bombay, India
Xiaoqing Wen, Kyushu Institute of Technology, Japan
Hiroyuki Yotsuyanagi, Tokushima University, Japan

Past Steering Committee