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    About WRTLT       Present Event    

The purpose of IEEE Workshop on RTL and High Level Testing (WRTLT) is to bring researchers and practitioners on LSI testing from all over the world together to exchange ideas and experiences on register transfer level (RTL) and high level testing.  


18th Workshop on RTL and High Level Testing
Nov. 30 - Dec. 1, 2017, Taipei, Taiwan

  Past Events
17th WRTLT'16 Hiroshima, Japan November 24-25, 2016
16th WRTLT'15 Bombay, India November 25-26, 2015
15th WRTLT'14 Hangzhou, China November 19-20, 2014
14th WRTLT'13 Yilan, Taiwan November 21-22, 2013
13th WRTLT'12 Niigata, Japan November 22-23, 2012
12th WRTLT'11 Jaipur, India November 25-26, 2011
11th WRTLT'10 Shanghai, China December 5-6, 2010
10th WRTLT'09 Hong Kong, China November 27-28, 2009
9th WRTLT'08 Sapporo, Japan November 27-28, 2008
8th WRTLT'07 Beijing, China October 12-13, 2007
7th WRTLT'06 Fukuoka, Japan November 23-24, 2006
6th WRTLT'05 Harbin, China July 20-21, 2005
5th WRTLT'04 Osaca, Japan November 11-12, 2004
4th WRTLT'03 Xian, China November 20-21, 2003
3rd WRTLT'02 Guam, USA November 21-22, 2002
2nd WRTLT'01 Nara, Japan November 22-23, 2001
1st WRTLT'00 Changsha, China September 26-27, 2000
Steering Committee (2014-2016)

Huawei Li, Chinese Academy of Sciences, China

Vice Chair

Toshinori Hosokawa, Nihon University, Japan


Masaki Hashizume, University of Tokushima, Japan
Tomoo Inoue, Hiroshima City University, Japan
Kazuhiko Iwasaki, Tokyo Metropolitan University, Japan
Erik Larsson, Lund University, Sweden
Kuen-Jong Lee, National Cheng Kung University, Taiwan
Satoshi Ohtake, Oita University, Japan
Alex Orailoglu, University of California, San Diego, USA
Kewal K. Saluja, University of Wisconsin, USA
Virendra Singh, Indian Institute of Technology Bombay, India
Hideo Tamamoto, Akita University, Japan
Dong Xiang, Tsinghua University, China

Past Steering Committee