Welcome to WRTLT

The purpose of IEEE Workshop on RTL and High Level Testing (WRTLT) is to bring researchers and practitioners on LSI testing from all over the world together to exchange ideas and experiences on register transfer level (RTL) and high level testing.   

Present Workshop

21th Workshop on RTL and High Level Testing
November 25 – 26, 2020 (Virtual Conference)

Steering Committee (2020-2022)


Hiroyuki Yotsuyanagi, Tokushima University, Japan


Shyue-Kun Lu, National Taiwan University of Science and Technology, Taiwan


Masayuki Arai, Nihon University, Japan
Toshinori Hosokawa, Nihon University, Japan
Zhengfeng Huang, Hefei University of Technology, China
Hideyuki Ichihara, Hiroshima City University, Japan
Erik Larsson, Lund University, Sweden
Kuen-Jong Lee, National Cheng Kung University, Taiwan
Huawei Li, Chinese Academy of Sciences, China
James Chien-Mo Li, National Taiwan University, Taiwan
Satoshi Ohtake, Oita University, Japan
Matteo Sonza Reorda, Politecnico di Torino, Italy
Virendra Singh, Indian Institute of Technology Bombay, India
Xiaoqing Wen, Kyushu Institute of Technology, Japan